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Properties of ZnTe

Properties of ZnTe (Zinc telluride):

Compound NameZinc telluride
Chemical FormulaZnTe
Molar Mass192.98 g/mol

Chemical structure
ZnTe (Zinc telluride) - Chemical structure
Lewis structure
3D molecular structure
Physical properties
Appearancered crystals
Density6.3400 g/cm³
Helium 0.0001786
Iridium 22.562
Thermochemistry
Heat Capacity264.00 J/(mol·K)
Boron nitride 19.7
Hentriacontane 912

Elemental composition of ZnTe
ElementSymbolAtomic weightAtomsMass percent
ZincZn65.38133.8792
TelluriumTe127.60166.1208
Mass Percent CompositionAtomic Percent Composition
Zn: 33.88%Te: 66.12%
Zn Zinc (33.88%)
Te Tellurium (66.12%)
Zn: 50.00%Te: 50.00%
Zn Zinc (50.00%)
Te Tellurium (50.00%)
Mass Percent Composition
Zn: 33.88%Te: 66.12%
Zn Zinc (33.88%)
Te Tellurium (66.12%)
Atomic Percent Composition
Zn: 50.00%Te: 50.00%
Zn Zinc (50.00%)
Te Tellurium (50.00%)
Identifiers
CAS Number1315-11-3
SMILES[TeH+2]12[ZnH2-2][TeH+2]3[ZnH2-2][TeH+2]([ZnH-2]14)[ZnH-2]1[Te+2]5([ZnH-2]38)[Zn-2]26[TeH+2]2[ZnH-2]([Te+2]4)[TeH+2]1[ZnH2-2][TeH+2]3[ZnH-2]2[Te+2][ZnH-2]([TeH+2]6[ZnH-2]([TeH+2])[TeH+2]68)[TeH+2]([ZnH2-2]6)[ZnH-2]35
Hill formulaTeZn

Related
Molecular weight calculator
Oxidation state calculator

Zinc Telluride (ZnTe): Chemical Compound

Scientific Review Article | Chemistry Reference Series

Abstract

Zinc telluride (ZnTe) represents a binary semiconductor compound with the chemical formula ZnTe and molar mass of 192.99 g/mol. This inorganic material crystallizes in the zincblende structure with a cubic lattice constant of 610.1 pm and exhibits a direct band gap of 2.26 eV. The compound typically manifests as a p-type semiconductor with distinctive red crystalline appearance or gray-brown powder form. Zinc telluride demonstrates significant applications in optoelectronic devices, including light-emitting diodes, laser diodes, and solar cells. Its nonlinear optical properties enable utilization in terahertz spectroscopy and imaging technologies. The material exhibits electron mobility of 340 cm²/(V·s), thermal conductivity of 108 mW/(cm·K), and refractive index of 3.56. Zinc telluride maintains stability under standard conditions but undergoes combustion in oxygen-rich environments under strong optical irradiation.

Introduction

Zinc telluride constitutes an important II-VI semiconductor compound with substantial technological significance in modern optoelectronics and photonics. Classified as an inorganic binary compound, ZnTe bridges the gap between wider bandgap II-VI materials like ZnSe and narrower bandgap compounds such as CdTe. The material's discovery dates to early investigations of chalcogenide compounds in the late 19th century, with systematic characterization emerging during the development of semiconductor physics in the mid-20th century. Zinc telluride exhibits typical semiconductor behavior with a direct transition between valence and conduction bands, making it particularly suitable for photonic applications. The compound's ability to accept various dopants, including transition metals like vanadium and manganese, enables precise tuning of its electronic and optical properties for specialized applications.

Molecular Structure and Bonding

Molecular Geometry and Electronic Structure

Zinc telluride crystallizes in the cubic zincblende structure with space group F43m (number 216). This structure type features tetrahedral coordination geometry around both zinc and tellurium atoms, with each zinc cation surrounded by four telluride anions and vice versa. The lattice parameter measures 610.1 pm at room temperature, resulting in a Zn-Te bond length of approximately 264 pm. The electronic configuration involves sp³ hybridization at both metal centers, with zinc atoms (electron configuration [Ar]3d¹⁰4s²) adopting a +2 oxidation state and tellurium atoms (electron configuration [Kr]4d¹⁰5s²5p⁴) adopting a -2 oxidation state. The compound exhibits predominantly ionic character with partial covalent contribution, estimated at approximately 30% covalent character based on Phillips ionicity scale calculations. The zincblende structure represents a departure from the ideal diamond cubic structure due to the different atomic species, resulting in non-zero dipole moment within the unit cell.

Chemical Bonding and Intermolecular Forces

The chemical bonding in zinc telluride primarily involves ionic interactions between Zn²⁺ and Te²⁻ ions, with significant covalent character arising from overlap between zinc 4s4p orbitals and tellurium 5s5p orbitals. The bond energy estimates range from 180 to 220 kJ/mol, intermediate between purely ionic and purely covalent II-VI compounds. The Madelung constant for the zincblende structure calculates to approximately 1.6381, contributing to the compound's cohesive energy of 5.8 eV per formula unit. Intermolecular forces in solid ZnTe include dipole-dipole interactions between adjacent unit cells and van der Waals forces, though these are substantially weaker than the primary ionic-covalent bonds. The compound exhibits minimal hydrogen bonding capability due to absence of hydrogen atoms and limited polar character. The calculated molecular dipole moment for a ZnTe molecule in gas phase approximates 5.2 D, reflecting the significant electronegativity difference between zinc (1.65) and tellurium (2.1).

Physical Properties

Phase Behavior and Thermodynamic Properties

Zinc telluride manifests as red crystals when purified by sublimation or as gray-brown powder in polycrystalline form. The compound exhibits a melting point of 1568 K (1295 °C) under atmospheric pressure, with decomposition observed prior to boiling. The density measures 6.34 g/cm³ at 298 K, with minimal temperature dependence due to low thermal expansion coefficient of 8.5 × 10⁻⁶ K⁻¹. The heat capacity at constant pressure measures 264 J/(kg·K) at room temperature, following the Debye model with characteristic Debye temperature of 280 K. The standard enthalpy of formation (ΔH°f) calculates to -216 kJ/mol from constituent elements, with entropy (S°) of 77 J/(mol·K). The compound undergoes a phase transition from zincblende to rocksalt structure at approximately 12 GPa pressure, accompanied by a 15% volume reduction. The thermal conductivity measures 108 mW/(cm·K) at 300 K, decreasing with temperature according to T⁻¹ dependence above 100 K.

Spectroscopic Characteristics

Zinc telluride exhibits characteristic spectroscopic signatures across multiple regions. Infrared spectroscopy reveals phonon modes at 177 cm⁻¹ (TO mode) and 206 cm⁻¹ (LO mode), with temperature-dependent shifts of -0.015 cm⁻¹/K. Raman spectroscopy shows a dominant peak at 206 cm⁻¹ corresponding to the longitudinal optical phonon, with weaker features at 120 cm⁻¹ and 140 cm⁻¹ associated with second-order processes. Ultraviolet-visible spectroscopy demonstrates a fundamental absorption edge at 550 nm (2.26 eV) at room temperature, with excitonic features observable at low temperatures. Photoluminescence spectra display near-band-edge emission at 545 nm with full width at half maximum of 30 meV at 10 K. X-ray photoelectron spectroscopy shows Zn 2p₃/₂ and 2p₁/₂ peaks at 1021.6 eV and 1044.7 eV respectively, while Te 3d₅/₂ and 3d₃/₂ peaks appear at 572.3 eV and 582.7 eV. Mass spectrometric analysis of vaporized material reveals predominant ZnTe⁺ ions along with Zn₂Te⁺ and Te₂⁺ fragments.

Chemical Properties and Reactivity

Reaction Mechanisms and Kinetics

Zinc telluride demonstrates moderate chemical stability under ambient conditions but undergoes decomposition under specific circumstances. The compound exhibits resistance to hydrolysis in neutral aqueous environments, with dissolution rate below 10⁻⁹ mol/(m²·s) at pH 7. Acidic conditions promote decomposition according to the reaction: ZnTe + 2H⁺ → Zn²⁺ + H₂Te, with rate constant of 3.2 × 10⁻⁴ s⁻¹ at 0.1 M HCl concentration. Oxidation occurs readily in air above 673 K, forming zinc oxide and tellurium dioxide with activation energy of 85 kJ/mol. The compound reacts with halogens at room temperature, particularly with fluorine and chlorine, forming zinc halides and tellurium tetrahalides. Thermal decomposition initiates at 1073 K under inert atmosphere, proceeding through tellurium evaporation and leaving zinc-rich material. Doping reactions with elements such as vanadium and manganese proceed via diffusion mechanisms with activation energies between 1.8 and 2.3 eV, depending on the dopant species.

Acid-Base and Redox Properties

Zinc telluride exhibits amphoteric character in extreme pH conditions, though it predominantly behaves as a base due to the telluride ion's strong basicity. The telluride ion (Te²⁻) demonstrates a hydrolysis constant pKb of 2.6, making it one of the stronger bases among chalcogenides. The compound displays limited solubility in alkaline solutions (10⁻⁵ M at pH 14) due to partial formation of telluride and zincate ions. Redox properties include a standard reduction potential of -0.76 V for the Zn²⁺/Zn couple and -1.14 V for the Te/Te²⁻ couple in aqueous solutions. The compound functions as a reducing agent toward strong oxidizing agents, with standard electrode potential of +0.53 V for the ZnTe/Zn²⁺ + Te couple. Electrochemical impedance spectroscopy reveals charge transfer resistance of 10⁵ Ω·cm² in neutral solutions, decreasing to 10³ Ω·cm² in acidic media. The flatband potential measures -0.85 V versus standard hydrogen electrode at pH 7, indicating n-type behavior in electrochemical systems.

Synthesis and Preparation Methods

Laboratory Synthesis Routes

Laboratory synthesis of zinc telluride typically employs direct combination of elemental zinc and tellurium at elevated temperatures. The stoichiometric reaction: Zn + Te → ZnTe proceeds with 98% yield at 1173 K under vacuum or inert atmosphere. Alternative routes include precipitation from aqueous solutions containing zinc salts and telluride sources, though this method often produces impure materials with oxygen incorporation. Chemical vapor transport using iodine as transport agent enables purification of ZnTe through sublimation at 1073 K with temperature gradient of 50 K/cm. Molecular beam epitaxy provides high-purity crystalline films with growth rates of 0.1-1.0 μm/h at substrate temperatures of 573-673 K. Liquid phase epitaxy from zinc-rich solutions produces thick films with carrier concentrations below 10¹⁵ cm⁻³. Electrochemical deposition from non-aqueous solutions containing zinc and tellurium precursors yields polycrystalline films with grain sizes up to 500 nm.

Industrial Production Methods

Industrial production of zinc telluride utilizes scaled-up versions of laboratory methods with engineering modifications for economic viability. The Bridgman-Stockbarger method produces large single crystals up to 10 cm diameter by gradual cooling of stoichiometric melts through a temperature gradient. Vertical gradient freeze techniques yield crystals with reduced defect densities through controlled solidification rates of 1-3 mm/h. Chemical vapor deposition employing dimethylzinc and diethyltelluride precursors enables large-area film deposition at 623-723 K with growth rates up to 10 μm/h. Sputtering from ZnTe targets provides uniform coatings on various substrates, including glass and metal foils, with deposition rates of 100-500 nm/h. Industrial purity standards require tellurium and zinc with minimum purity of 99.9999% (6N purity) for electronic-grade material, while solar-grade material accepts 99.999% (5N purity) precursors. Production costs approximate $500-1000 per kilogram for electronic-grade material, with yield losses primarily from tellurium evaporation during processing.

Analytical Methods and Characterization

Identification and Quantification

X-ray diffraction provides definitive identification of zinc telluride through its characteristic zincblende pattern with strongest reflections at 25.6° (111), 29.9° (200), and 42.6° (220) 2θ angles using Cu Kα radiation. Energy-dispersive X-ray spectroscopy confirms stoichiometric composition with Zn:Te ratio of 1:1 within 1% accuracy. Rutherford backscattering spectrometry measures composition depth profiles with sensitivity to 0.1 at% deviation from stoichiometry. Inductively coupled plasma mass spectrometry quantifies trace impurities at parts-per-billion levels, particularly critical for copper, iron, and sodium contaminants. Hall effect measurements characterize electrical properties with accuracy of 5% for carrier concentration and 10% for mobility values. Spectroscopic ellipsometry determines optical constants with precision of 0.01 for refractive index and 0.001 for extinction coefficient. Photoluminescence mapping identifies spatial variations in crystal quality with resolution down to 1 μm.

Purity Assessment and Quality Control

Purity assessment of zinc telluride follows established protocols for semiconductor materials. Electronic-grade material requires total impurity content below 10 parts per million atomic, with specific limits of 1 ppma for transition metals and 5 ppma for alkali metals. Secondary ion mass spectrometry provides depth profiling of impurities with detection limits below 10¹⁵ atoms/cm³. X-ray rocking curve analysis measures crystal perfection through full width at half maximum values, with commercial material typically showing 30-100 arcseconds for single crystals. Etch pit density quantification using Huber etch solution (HNO₃:HF:H₂O = 1:1:2) reveals dislocation densities between 10³ and 10⁵ cm⁻² for bulk crystals. Fourier-transform infrared spectroscopy assesses hydrogen and oxygen content through their vibrational absorption bands at 3000-3500 cm⁻¹ and 1000-1200 cm⁻¹ respectively. Thermal stability testing involves cycling between 173 K and 473 K with monitoring of electrical and optical properties to ensure performance consistency.

Applications and Uses

Industrial and Commercial Applications

Zinc telluride finds extensive application in optoelectronic devices due to its favorable semiconductor properties. The compound serves as active material in blue light-emitting diodes and laser diodes operating at wavelengths around 550 nm. In photovoltaic technology, ZnTe functions as a p-type window layer in cadmium telluride solar cells, enhancing hole collection efficiency and providing estimated 2-3% absolute efficiency improvement. The material's use in microwave generators relies on its high electron mobility and saturation velocity of 2 × 10⁷ cm/s. Electro-optic modulators utilize the linear electro-optic coefficient of 4.3 pm/V at 633 nm wavelength for telecommunications applications. Radiation detectors employ zinc telluride for X-ray and gamma-ray detection due to its high atomic number constituents and wide bandgap, providing energy resolution of 5% at 662 keV. The global market for zinc telluride approximates 10 metric tons annually, valued at $5-10 million, with primary demand from research institutions and specialized optoelectronics manufacturers.

Research Applications and Emerging Uses

Research applications of zinc telluride continue to expand into emerging technological areas. The compound's nonlinear optical properties enable efficient terahertz generation and detection through optical rectification and electro-optic sampling, with conversion efficiencies up to 10⁻⁴ in pulsed systems. Quantum dot implementations using ZnTe nanocrystals show promise for single-photon sources with emission rates up to 10 MHz at room temperature. Dilute magnetic semiconductor research investigates manganese-doped ZnTe for spintronic applications, demonstrating Curie temperatures up to 300 K for certain compositions. Photorefractive devices utilizing vanadium-doped material exhibit response times below 100 ms at 633 nm with diffraction efficiencies exceeding 50%. Heterostructures with cadmium zinc telluride enable bandgap engineering for mid-infrared detectors operating at 3-5 μm wavelength. Recent patent activity focuses on ZnTe-based thermoelectric materials with ZT values approaching 1.2 at 600 K through nanostructuring and alloying approaches.

Historical Development and Discovery

The investigation of zinc telluride parallels the development of chalcogenide chemistry in the late 19th century. Early studies by chemists including Muthmann and Deutsch in the 1890s identified the compound's formation through direct element combination. Systematic characterization commenced in the 1920s with determination of crystal structure using newly developed X-ray diffraction techniques. The semiconductor properties of ZnTe received significant attention during the 1950s alongside other II-VI compounds, with early measurements of electrical conductivity and optical absorption published by researchers at Purdue University and the University of Pennsylvania. The 1960s saw development of crystal growth techniques, particularly the Bridgman method, enabling production of large single crystals for fundamental studies. Optoelectronic applications emerged in the 1970s with demonstrations of light emission from p-n junctions. The 1980s brought advances in thin-film deposition methods, notably molecular beam epitaxy and metalorganic chemical vapor deposition, facilitating sophisticated device structures. Recent decades have focused on nanoscale forms and doped variants for specialized applications in photonics and spintronics.

Conclusion

Zinc telluride represents a well-characterized II-VI semiconductor compound with established applications in optoelectronics and emerging uses in photonic technologies. The material's zincblende crystal structure, direct bandgap of 2.26 eV, and p-type conductivity make it particularly suitable for light-emitting devices and solar cell applications. Its nonlinear optical properties enable efficient terahertz generation and detection, while dopant incorporation allows tuning of electronic and magnetic characteristics. Challenges remain in reducing defect densities in bulk crystals and controlling stoichiometry during thin-film deposition. Future research directions include development of heterostructures with other II-VI materials, exploration of quantum confinement effects in nanostructured forms, and optimization of doping protocols for enhanced device performance. The compound continues to offer opportunities for fundamental studies of semiconductor physics and practical applications in advanced optoelectronic systems.

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