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Properties of Xef4

Properties of XeF4 (Xenon tetrafluoride):

Compound NameXenon tetrafluoride
Chemical FormulaXeF4
Molar Mass207.2866128 g/mol

Chemical structure
XeF4 (Xenon tetrafluoride) - Chemical structure
Lewis structure
3D molecular structure
Physical properties
AppearanceWhite solid
Solubilityreacts
Density4.0400 g/cm³
Helium 0.0001786
Iridium 22.562
Melting117.00 °C
Helium -270.973
Hafnium carbide 3958
Thermochemistry
Enthalpy of Formation-251.00 kJ/mol
Adipic acid -994.3
Tricarbon 820.06
Standard Entropy146.00 J/(mol·K)
Ruthenium(III) iodide -247
Chlordecone 764

Elemental composition of XeF4
ElementSymbolAtomic weightAtomsMass percent
XenonXe131.293163.3389
FluorineF18.9984032436.6611
Mass Percent CompositionAtomic Percent Composition
Xe: 63.34%F: 36.66%
Xe Xenon (63.34%)
F Fluorine (36.66%)
Xe: 20.00%F: 80.00%
Xe Xenon (20.00%)
F Fluorine (80.00%)
Mass Percent Composition
Xe: 63.34%F: 36.66%
Xe Xenon (63.34%)
F Fluorine (36.66%)
Atomic Percent Composition
Xe: 20.00%F: 80.00%
Xe Xenon (20.00%)
F Fluorine (80.00%)
Identifiers
CAS Number13709-61-0
SMILESF[Xe](F)(F)F
Hill formulaF4Xe

Related compounds
FormulaCompound name
XeF2Xenon difluoride
XeF8Xenon octafluoride
XeF6Xenon hexafluoride

Sample reactions for XeF4
EquationReaction type
XeF4 + SF4 = Xe + SF6double replacement

Related
Molecular weight calculator
Oxidation state calculator

Xenon tetrafluoride (XeF₄): Chemical Compound

Scientific Review Article | Chemistry Reference Series

Abstract

Xenon tetrafluoride (XeF₄) represents a landmark compound in inorganic chemistry as the first discovered binary compound of a noble gas. This colorless crystalline solid exhibits a square planar molecular geometry with D4h symmetry and sublimes at 117 °C. With a molar mass of 207.2836 grams per mole and density of 4.040 grams per cubic centimeter in solid form, XeF₄ demonstrates significant thermal stability despite its reactive fluorine content. The compound forms through direct combination of xenon and fluorine gases at elevated temperatures, typically 400 °C, in an exothermic reaction releasing 251 kilojoules per mole. Xenon tetrafluoride serves as a versatile precursor for synthesizing various xenon compounds and finds specialized applications in analytical chemistry for trace metal detection in silicone-based materials.

Introduction

Xenon tetrafluoride occupies a historically significant position in the development of noble gas chemistry, challenging the long-held dogma that noble gases were completely inert and incapable of forming stable compounds. This inorganic compound, first synthesized in 1962, demonstrated that xenon could exhibit oxidation states beyond zero, specifically the +4 oxidation state in this case. The discovery fundamentally altered understanding of chemical bonding and expanded the boundaries of periodic table reactivity. Xenon tetrafluoride belongs to the class of noble gas compounds and specifically represents a hypervalent molecule where the central xenon atom exceeds the octet rule. Its synthesis and characterization marked a paradigm shift in chemical theory, providing experimental evidence that noble gases could participate in covalent bond formation under appropriate conditions.

Molecular Structure and Bonding

Molecular Geometry and Electronic Structure

Xenon tetrafluoride exhibits a square planar molecular geometry with D4h symmetry, as confirmed by both nuclear magnetic resonance spectroscopy and X-ray crystallography in 1963, with subsequent verification through neutron diffraction studies. According to valence shell electron pair repulsion (VSEPR) theory, the xenon center possesses six electron domains: four bonding pairs to fluorine atoms and two non-bonding lone pairs. These lone pairs occupy mutually trans positions in the equatorial plane, resulting in the observed square planar configuration. The Xe-F bond length measures 1.953 angstroms, with F-Xe-F bond angles of 90.0° for adjacent fluorines and 180.0° for trans fluorines. The electronic configuration of xenon in XeF₄ involves sp³d² hybridization of the central atom, with the lone pairs occupying equatorial positions to minimize electron pair repulsion. The molecule possesses a dipole moment of 0 Debye, consistent with its highly symmetric structure.

Chemical Bonding and Intermolecular Forces

The bonding in xenon tetrafluoride involves significant covalent character with partial ionic contribution due to the high electronegativity of fluorine (3.98) compared to xenon (2.6). Molecular orbital theory describes the bonding as involving donation of electron density from fluorine p orbitals to xenon d orbitals, forming four equivalent Xe-F bonds with bond dissociation energy of approximately 130 kilojoules per mole. The compound exists as a crystalline solid at room temperature, with intermolecular forces dominated by van der Waals interactions between molecular units. The crystal packing arrangement maximizes fluorine-fluorine contacts between adjacent molecules while maintaining the square planar geometry of individual XeF₄ units. The compound demonstrates limited solubility in anhydrous hydrogen fluoride, where it may form fluoroacidic complexes, but hydrolyzes rapidly in aqueous environments.

Physical Properties

Phase Behavior and Thermodynamic Properties

Xenon tetrafluoride appears as a colorless crystalline solid at standard temperature and pressure. The compound sublimes at 117 °C without melting at atmospheric pressure, though under pressure it may melt at higher temperatures. The solid density measures 4.040 grams per cubic centimeter at 25 °C. Thermodynamic parameters include a standard enthalpy of formation (ΔH°f) of −251 kilojoules per mole and standard entropy (S°) of 146 joules per mole per kelvin. The compound exhibits thermal stability up to approximately 400 °C, above which decomposition to elemental xenon and fluorine occurs. The sublimation enthalpy measures 64 kilojoules per mole, consistent with its molecular solid character with relatively weak intermolecular forces. Xenon tetrafluoride crystals belong to the monoclinic crystal system with space group P2₁/c and unit cell parameters a = 9.325 Å, b = 8.702 Å, c = 6.325 Å, and β = 93.64°.

Spectroscopic Characteristics

Infrared spectroscopy of xenon tetrafluoride reveals three fundamental vibrational modes: the symmetric stretch (ν₁) at 543 cm⁻¹, the asymmetric stretch (ν₃) at 586 cm⁻¹, and the bending mode (ν₄) at 502 cm⁻¹. The ν₂ mode is IR-inactive due to molecular symmetry. Raman spectroscopy shows strong bands at 554 cm⁻¹ (ν₁ symmetric stretch) and 218 cm⁻¹ (ν₂ bending mode). 129Xe nuclear magnetic resonance spectroscopy displays a characteristic chemical shift of −430 ppm relative to XeO₃, consistent with the xenon(IV) oxidation state. 19F NMR exhibits a single resonance due to rapid fluorine exchange in solution, with a chemical shift of 125 ppm relative to CFCl₃. Mass spectrometric analysis shows a parent ion peak at m/z 207 corresponding to XeF₄⁺, with major fragment ions at m/z 188 (XeF₃⁺), 169 (XeF₂⁺), 150 (XeF⁺), and 131 (Xe⁺).

Chemical Properties and Reactivity

Reaction Mechanisms and Kinetics

Xenon tetrafluoride demonstrates versatile reactivity despite its apparent thermal stability. Hydrolysis represents one of the most characteristic reactions, proceeding quantitatively at low temperatures according to the stoichiometry: 6XeF₄ + 12H₂O → 2XeO₃ + 4Xe + 3O₂ + 24HF. This complex redox process involves simultaneous oxidation of water to oxygen and reduction of xenon(IV) to elemental xenon and xenon(VI) in trioxide. The reaction proceeds through intermediate oxygen fluoride species and exhibits autocatalytic behavior in the presence of HF. Xenon tetrafluoride functions as a strong fluorinating agent, capable of converting platinum to platinum tetrafluoride: XeF₄ + Pt → PtF₄ + Xe. At elevated temperatures (400 °C), XeF₄ undergoes disproportionation with xenon metal to form xenon difluoride: XeF₄ + Xe → 2XeF₂. The equilibrium constant for this reaction favors XeF₂ formation at higher temperatures.

Acid-Base and Redox Properties

Xenon tetrafluoride exhibits both Lewis acid and fluoride donor behavior. Reaction with fluoride ion acceptors such as bismuth pentafluoride generates the XeF₃⁺ cation: BiF₅ + XeF₄ → XeF₃BiF₆. This fluoroacidic behavior demonstrates the compound's ability to function as a fluoride donor. Conversely, reaction with fluoride ion donors like cesium fluoride forms the XeF₅⁻ anion: CsF + XeF₄ → CsXeF₅. The standard reduction potential for the XeF₄/Xe couple measures approximately +2.64 volts, indicating strong oxidizing power. The compound functions as a selective fluorinating agent in organic chemistry, though its use is limited by competing hydrolysis and side reactions. Xenon tetrafluoride demonstrates stability in anhydrous conditions but reacts vigorously with proton donors, moisture, and reducing agents.

Synthesis and Preparation Methods

Laboratory Synthesis Routes

The primary synthesis method for xenon tetrafluoride involves direct combination of the elements in a 1:2 molar ratio (Xe:F₂) at elevated temperature and pressure. Typical conditions employ a nickel or Monel vessel heated to 400 °C with a xenon to fluorine ratio of approximately 1:5 to ensure complete conversion. The reaction vessel material must resist fluoride corrosion, with nickel providing effective passivation through formation of a protective nickel fluoride layer. The reaction proceeds exothermically with enthalpy change of −251 kilojoules per mole. Controlling the product distribution presents challenges as xenon difluoride, tetrafluoride, and hexafluoride exist in equilibrium under reaction conditions, with the tetrafluoride favored at intermediate temperatures and fluorine pressures. Purification typically employs fractional sublimation, exploiting the relatively low volatility of XeF₄ compared to XeF₂ (sublimes at 114 °C) and XeF₆ (melts at 49.5 °C). Alternative synthesis routes include photochemical activation using gamma or ultraviolet radiation in anhydrous hydrogen fluoride solvent with catalytic oxygen, which provides improved selectivity for tetrafluoride formation by preventing over-fluorination to hexafluoride.

Analytical Methods and Characterization

Identification and Quantification

Xenon tetrafluoride identification relies primarily on vibrational spectroscopy, with infrared spectroscopy providing characteristic bands at 586 cm⁻¹ (asymmetric stretch), 543 cm⁻¹ (symmetric stretch), and 502 cm⁻¹ (bending mode). Raman spectroscopy complements IR with strong bands at 554 cm⁻¹ and 218 cm⁻¹. X-ray crystallography provides definitive structural confirmation, revealing square planar molecular geometry with Xe-F bond lengths of 1.953 Å. Quantitative analysis typically employs hydrolysis followed by measurement of evolved xenon gas volumetrically or by gas chromatography. Alternatively, reaction with mercury produces mercury(II) fluoride and xenon gas, which can be quantified manometrically: XeF₄ + 2Hg → 2HgF₂ + Xe. Fluoride ion selective electrode measurements after hydrolysis provide quantification of fluorine content. Mass spectrometry offers sensitive detection with characteristic fragmentation pattern including parent ion at m/z 207 and sequential loss of fluorine atoms.

Purity Assessment and Quality Control

Purity assessment of xenon tetrafluoride focuses primarily on contamination by other xenon fluorides, particularly XeF₂ and XeF₆. Differential sublimation techniques exploit volatility differences, with XeF₂ subliming at 114 °C, XeF₄ at 117 °C, and XeF₆ melting at 49.5 °C. Vibrational spectroscopy provides quantitative analysis of mixtures through characteristic band intensities. NMR spectroscopy, particularly 129Xe NMR, distinguishes oxidation states with chemical shifts of −430 ppm for Xe(IV) in XeF₄, +610 ppm for Xe(II) in XeF₂, and +710 ppm for Xe(VI) in XeF₆. Handling and storage require strictly anhydrous conditions, typically in nickel or Monel containers with careful exclusion of moisture. Decomposition products include xenon, oxygen, and hydrogen fluoride, which can be monitored to assess compound stability over time.

Applications and Uses

Industrial and Commercial Applications

Xenon tetrafluoride finds limited but specialized industrial applications, primarily as a fluorinating agent in research and development settings. Its most established application involves the analysis of trace metal impurities in silicone rubber. The compound reacts with silicone matrix material to form volatile silicon tetrafluoride and other gaseous products, leaving behind metal impurities that can be analyzed by techniques such as atomic absorption spectroscopy or inductively coupled plasma mass spectrometry. This degradation method provides effective sample preparation for quality control in silicone manufacturing. Xenon tetrafluoride serves as a precursor for synthesizing other xenon compounds, including xenon trioxide through controlled hydrolysis and various xenon fluoride complexes through reaction with metal fluorides. The compound has been investigated as an etching agent in microelectronics fabrication, though its use remains primarily experimental due to handling challenges and cost considerations.

Historical Development and Discovery

The discovery of xenon tetrafluoride in 1962 by chemist Neil Bartlett marked a watershed moment in inorganic chemistry, definitively disproving the long-standing belief that noble gases were completely inert and incapable of forming stable compounds. This breakthrough followed theoretical predictions by Linus Pauling in 1933 that xenon could form compounds with fluorine and oxygen, though experimental verification eluded researchers for nearly three decades. Bartlett's initial work involved platinum hexafluoride and oxygen, leading to the realization that xenon had similar ionization energy to molecular oxygen and might form analogous compounds. The first successful synthesis employed direct combination of xenon and fluorine gases in a nickel vessel at 400 °C. Structural characterization by NMR spectroscopy and X-ray crystallography in 1963 confirmed the square planar geometry, which aligned with predictions from VSEPR theory. This discovery catalyzed extensive research into noble gas chemistry throughout the 1960s and 1970s, leading to the synthesis and characterization of numerous xenon compounds with fluorine, oxygen, and other elements. The development of noble gas chemistry represented one of the most significant expansions of chemical bonding theory in the 20th century.

Conclusion

Xenon tetrafluoride stands as a historically significant compound that fundamentally altered understanding of chemical bonding and noble gas reactivity. Its square planar molecular geometry with D4h symmetry provides a textbook example of VSEPR theory application to hypervalent molecules. The compound demonstrates remarkable thermal stability despite its strong oxidizing and fluorinating capabilities. Synthesis methods have been refined since its initial discovery, though challenges remain in controlling product distribution and purity due to equilibrium with other xenon fluorides. Specialized applications in analytical chemistry and materials processing continue to be developed, particularly in trace metal analysis and selective fluorination reactions. Ongoing research focuses on developing more efficient synthesis routes, exploring new derivatives and complexes, and investigating potential applications in electronics and energy storage. Xenon tetrafluoride remains a compound of both historical importance and continuing scientific interest in the field of main group and noble gas chemistry.

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