Printed from https://www.webqc.org

Properties of XeF2

Properties of XeF2 (Xenon difluoride):

Compound NameXenon difluoride
Chemical FormulaXeF2
Molar Mass169.2898064 g/mol

Chemical structure
XeF2 (Xenon difluoride) - Chemical structure
Lewis structure
3D molecular structure
Physical properties
AppearanceWhite solid
Solubility25.0 g/100mL
Density4.3200 g/cm³
Helium 0.0001786
Iridium 22.562
Melting128.60 °C
Helium -270.973
Hafnium carbide 3958
Thermochemistry
Enthalpy of Formation-108.00 kJ/mol
Adipic acid -994.3
Tricarbon 820.06
Standard Entropy254.00 J/(mol·K)
Ruthenium(III) iodide -247
Chlordecone 764

Alternative Names

Xenon(II) fluoride

Elemental composition of XeF2
ElementSymbolAtomic weightAtomsMass percent
XenonXe131.293177.5552
FluorineF18.9984032222.4448
Mass Percent CompositionAtomic Percent Composition
Xe: 77.56%F: 22.44%
Xe Xenon (77.56%)
F Fluorine (22.44%)
Xe: 33.33%F: 66.67%
Xe Xenon (33.33%)
F Fluorine (66.67%)
Mass Percent Composition
Xe: 77.56%F: 22.44%
Xe Xenon (77.56%)
F Fluorine (22.44%)
Atomic Percent Composition
Xe: 33.33%F: 66.67%
Xe Xenon (33.33%)
F Fluorine (66.67%)
Identifiers
CAS Number13709-36-9
SMILESF[Xe]F
Hill formulaF2Xe

Related compounds
FormulaCompound name
XeF4Xenon tetrafluoride
XeF8Xenon octafluoride
XeF6Xenon hexafluoride

Related
Molecular weight calculator
Oxidation state calculator

Xenon difluoride (XeF₂): Chemical Compound

Scientific Review Article | Chemistry Reference Series

Abstract

Xenon difluoride (XeF₂) represents a significant milestone in inorganic chemistry as one of the first stable noble gas compounds synthesized. This crystalline solid exhibits a linear molecular geometry with Xe-F bond lengths measuring 197.73 ± 0.15 pm in the vapor phase. The compound demonstrates remarkable thermal stability with a melting point of 128.6 °C and a density of 4.32 g/cm³. XeF₂ functions as a powerful fluorinating and oxidizing agent, finding applications in organic synthesis and microelectronics manufacturing. Its synthesis involves the direct combination of xenon and fluorine gases under specific conditions of heat, irradiation, or electrical discharge. The compound's stability among xenon fluorides and its selective fluorination capabilities make it particularly valuable for specialized chemical transformations.

Introduction

Xenon difluoride belongs to the class of inorganic noble gas compounds, specifically xenon fluorides. Its discovery in 1962 marked a paradigm shift in chemical understanding, challenging the long-held belief that noble gases were entirely inert. The successful synthesis of XeF₂ demonstrated that under appropriate conditions, xenon could form stable compounds with highly electronegative elements. This breakthrough opened new avenues in main group chemistry and expanded the theoretical framework of chemical bonding. XeF₂ remains one of the most stable and extensively studied xenon compounds, serving as a foundational material for exploring higher oxidation states of xenon and other noble gas compounds.

Molecular Structure and Bonding

Molecular Geometry and Electronic Structure

Xenon difluoride adopts a linear molecular geometry consistent with VSEPR theory predictions for AX₂E₃ systems, where three lone pairs occupy equatorial positions. The Xe-F bond length measures 197.73 ± 0.15 pm in the vapor phase and extends to approximately 200 pm in the solid state. The xenon atom in XeF₂ utilizes sp³d hybridization with the five electron pairs arranged in a trigonal bipyramidal distribution. The fluorine atoms occupy axial positions while the three lone pairs reside in equatorial positions, minimizing electron pair repulsion. This arrangement results in a symmetric linear structure with D∞h point group symmetry. Molecular orbital theory describes the bonding in XeF₂ through delocalized three-center four-electron bonds, where the highest occupied molecular orbital represents a non-bonding orbital primarily localized on xenon.

Chemical Bonding and Intermolecular Forces

The Xe-F bonds in xenon difluoride exhibit covalent character with significant polarity due to the electronegativity difference between xenon (2.6) and fluorine (4.0). The total bond energy measures 267.8 kJ/mol, distributed as 184.1 kJ/mol for the first bond and 83.68 kJ/mol for the second bond. This bond energy distribution reflects the stabilization provided by the three-center bonding system. In the solid state, XeF₂ molecules pack with fluorine atoms of neighboring molecules avoiding the equatorial regions of adjacent molecules, consistent with the lone pair locations. The compound exhibits minimal dipole moment (0 D) due to its symmetric linear structure. Intermolecular forces are primarily weak van der Waals interactions, with no significant hydrogen bonding capacity. The crystal structure consists of parallel linear XeF₂ units with relatively weak intermolecular attractions.

Physical Properties

Phase Behavior and Thermodynamic Properties

Xenon difluoride presents as a dense, white crystalline solid with a nauseating odor. The compound melts at 128.6 °C to form a pale yellow liquid. The solid phase density measures 4.32 g/cm³ at room temperature. The standard enthalpy of formation (ΔHf°) is -108 kJ/mol, indicating thermodynamic stability relative to its elements. The standard entropy (S°) measures 254 J·mol⁻¹·K⁻¹. The vapor pressure reaches approximately 600 Pa at room temperature. XeF₂ demonstrates limited solubility in water (25 g/L at 0 °C) with gradual decomposition. It exhibits good solubility in several non-aqueous solvents including bromine pentafluoride, bromine trifluoride, iodine pentafluoride, anhydrous hydrogen fluoride (167 g/100 g HF at 29.95 °C), and acetonitrile without reduction or oxidation.

Spectroscopic Characteristics

Infrared spectroscopy of XeF₂ reveals a single strong absorption at 556 cm⁻¹ corresponding to the asymmetric Xe-F stretching vibration. The symmetric stretch is IR-inactive due to molecular symmetry but appears in Raman spectroscopy at approximately 515 cm⁻¹. 129Xe NMR spectroscopy shows a characteristic resonance at approximately δ -3200 ppm relative to XeOF₄, reflecting the deshielding effect of fluorine atoms. 19F NMR displays a single resonance due to equivalent fluorine atoms. UV-Vis spectroscopy shows no significant absorption in the visible region, consistent with its white appearance, but exhibits absorption in the ultraviolet region. Mass spectrometric analysis shows a parent ion peak at m/z 169 (XeF₂⁺) with characteristic fragmentation patterns including XeF⁺ (m/z 151) and Xe⁺ (m/z 132).

Chemical Properties and Reactivity

Reaction Mechanisms and Kinetics

Xenon difluoride functions as a potent fluorinating and oxidizing agent through several distinct reaction pathways. The compound undergoes oxidative fluorination reactions where it transfers fluorine atoms to substrates while being reduced to xenon gas. Reductive fluorination occurs with certain substrates where XeF₂ acts as both fluorinating agent and oxidant. The compound demonstrates particular effectiveness in aromatic fluorination, alkene addition reactions, and radical decarboxylative fluorination processes. Reaction rates with organic substrates vary significantly based on electronic and steric factors, with electron-rich aromatics undergoing faster fluorination. The compound exhibits remarkable selectivity for fluorinating heteroatoms over carbon atoms in many organic molecules. Decomposition occurs slowly upon contact with water vapor through hydrolysis reactions producing xenon gas, hydrogen fluoride, and oxygen.

Acid-Base and Redox Properties

Xenon difluoride demonstrates strong oxidizing characteristics with an estimated reduction potential of approximately +2.0 V for the XeF₂/Xe couple. The compound reacts with strong fluoride acceptors such as antimony pentafluoride to form cationic species including XeF⁺ and Xe₂F₃⁺, which exhibit even greater fluorinating power than neutral XeF₂. These cationic species participate in further redox reactions, including the formation of the paramagnetic Xe₂⁺ ion when combined with additional xenon gas. XeF₂ does not display typical Brønsted acid-base behavior in aqueous systems due to its instability in water, but functions as a Lewis acid through fluoride ion acceptance in appropriate solvent systems. The compound maintains stability in anhydrous conditions but decomposes in acidic or basic aqueous environments.

Synthesis and Preparation Methods

Laboratory Synthesis Routes

The primary laboratory synthesis of xenon difluoride involves the direct combination of elemental xenon and fluorine gases according to the stoichiometric equation: Xe + F₂ → XeF₂. This reaction requires activation energy provided by heat (typically 400 °C), ultraviolet irradiation, or electrical discharge. The reaction proceeds optimally at low pressures (approximately 1-2 atm) with equimolar amounts of xenon and fluorine. Recent studies indicate that purification of fluorine to remove hydrogen fluoride is unnecessary and may actually retard the reaction rate. The product forms as a solid which can be purified by fractional distillation or selective condensation using vacuum line techniques. An alternative synthesis route employs dioxygen difluoride (O₂F₂) as the fluorinating agent reacting with xenon gas at lower temperatures. This method offers advantages in controlling reaction exothermicity.

Industrial Production Methods

Industrial production of XeF₂ utilizes scaled-up versions of the laboratory synthesis, typically employing nickel reaction vessels equipped with transparent alumina windows for photochemical initiation. The process maintains strict control of stoichiometry, with slight excess xenon preferred to minimize formation of higher fluorides (XeF₄, XeF₆). Reaction conditions typically involve pressures of 2-5 atm and temperatures between 200-400 °C, with careful management of the exothermic reaction. The product is collected as a solid and purified through sublimation techniques. Production economics are influenced by the cost of xenon gas and safety considerations in handling fluorine. Major industrial applications drive production in batch processes rather than continuous flow systems due to the solid nature of the product and the need for careful control of reaction conditions.

Analytical Methods and Characterization

Identification and Quantification

Xenon difluoride is routinely identified and characterized through a combination of physical and spectroscopic techniques. X-ray crystallography provides definitive structural confirmation, revealing the linear molecular geometry and precise bond lengths. Infrared spectroscopy offers a rapid identification method through the characteristic strong absorption at 556 cm⁻¹. Raman spectroscopy complements IR data with the symmetric stretching vibration at 515 cm⁻¹. Quantitative analysis typically employs gravimetric methods following conversion to xenon gas or titration techniques using standardized solutions that react with XeF₂. Gas chromatographic methods can quantify xenon difluoride indirectly after hydrolysis and measurement of evolved xenon gas. Mass spectrometric techniques provide both qualitative identification through characteristic fragmentation patterns and quantitative analysis through selective ion monitoring.

Purity Assessment and Quality Control

Purity assessment of xenon difluoride focuses primarily on contamination by higher fluorides (XeF₄, XeF₆) and hydrolysis products. Differential scanning calorimetry monitors the melting behavior, with pure XeF₂ exhibiting a sharp melting endotherm at 128.6 °C. The presence of impurities typically broadens the melting range and depresses the melting point. Vibrational spectroscopy quantifies impurity levels through ratio measurements of characteristic absorption bands. Commercial quality specifications typically require minimum purity of 98-99% with limits on hydrolysable fluoride content. Storage stability is maintained in anhydrous conditions in nickel or Monel containers, with moisture exclusion being critical for long-term preservation. Handling protocols emphasize protection from atmospheric humidity to prevent decomposition during transfer operations.

Applications and Uses

Industrial and Commercial Applications

Xenon difluoride serves as a specialized fluorinating agent in industrial organic synthesis, particularly for introducing fluorine atoms into specific molecular positions while preserving other functional groups. The compound finds application in pharmaceutical intermediate synthesis where selective fluorination is required. In materials science, XeF₂ functions as an etching agent for silicon in microelectromechanical systems (MEMS) manufacturing, offering isotropic etching characteristics without requiring ion bombardment or external energy sources. The etching process follows the reaction: 2 XeF₂ + Si → 2 Xe + SiF₄. Commercial etching systems utilize pulsed delivery methods with expansion chambers to control the reaction. Additional applications include the preparation of N-fluoroammonium salts used as electrophilic fluorinating agents in organic synthesis, such as Selectfluor derivatives.

Research Applications and Emerging Uses

Research applications of xenon difluoride span fundamental and applied chemistry domains. In synthetic chemistry, XeF₂ enables exploration of novel fluorination methodologies, including radical fluorination processes and decarboxylative fluorination reactions. The compound serves as a precursor to other xenon compounds, including organoxenon species such as Xe(CF₃)₂. Materials research utilizes XeF₂ for surface modification of silicon-based materials and controlled etching processes at micro- and nanoscales. Coordination chemistry studies employ XeF₂ as a ligand toward various metal centers, forming complexes with unusually high coordination numbers. Recent investigations explore high-pressure phases of XeF₂ that exhibit semiconductor and metallic properties at pressures above 50 GPa. Emerging applications include potential use in fluorine storage and delivery systems for specialized manufacturing processes.

Historical Development and Discovery

The discovery of xenon difluoride in 1962 represented a watershed moment in chemical history, shattering the dogma of noble gas inertness that had prevailed since the discovery of these elements. The initial synthesis is attributed to multiple research groups working independently. Rudolf Hoppe at the University of Münster, Germany, likely produced the compound first in early 1962 using electrical discharge methods with xenon-fluorine mixtures. The first published report appeared in October 1962 by Chernick and colleagues, followed closely by work from Weeks, Chernick, and Matheson at Argonne National Laboratory who employed ultraviolet irradiation of xenon-fluorine mixtures in nickel systems with alumina windows. Shortly thereafter, Williamson demonstrated that the reaction proceeded under atmospheric pressure using sunlight irradiation, noting that even cloudy days provided sufficient activation energy. These nearly simultaneous discoveries ignited intense research activity into noble gas compounds throughout the 1960s, fundamentally expanding the boundaries of chemical bonding theory.

Conclusion

Xenon difluoride stands as a compound of substantial historical and contemporary significance in inorganic chemistry. Its synthesis demolished the concept of absolute noble gas inertness and stimulated development of bonding theories capable of explaining its stability and structure. The compound exhibits a unique combination of properties including thermal stability, selective fluorination capability, and versatile reactivity patterns. Applications in organic synthesis, materials processing, and microelectronics fabrication continue to expand as new methodologies develop. Current research directions focus on high-pressure phases with novel electronic properties, coordination complexes with unusual geometries, and development of more efficient synthetic routes. Xenon difluoride remains a foundational compound in noble gas chemistry and continues to offer insights into chemical bonding and reactivity at the frontier of main group element chemistry.

Chemical Compound Properties Database

This database contains physical properties and alternative names for thousands of chemical compounds. In chemical formula you may use:
  • Any chemical element. Capitalize the first letter in chemical symbol and use lower case for the remaining letters: Ca, Fe, Mg, Mn, S, O, H, C, N, Na, K, Cl, Al.
  • Functional groups: D, T, Ph, Me, Et, Bu, AcAc, For, Tos, Bz, TMS, tBu, Bzl, Bn, Dmg
  • parenthesis () or brackets [].
  • Common compound names.
Examples: H2O, CO2, CH4, NH3, NaCl, CaCO3, H2SO4, C6H12O6, water, carbon dioxide, methane, ammonia, sodium chloride, calcium carbonate, sulfuric acid, glucose.

The database includes melting points, boiling points, densities, and alternative names collected from various chemical sources.

What are compound properties?

Chemical compound properties include physical characteristics such as melting point, boiling point, and density, which are important for chemical identification and applications. Alternative names help identify the same compound when referenced by different naming conventions.

How to use this tool?

Enter a chemical formula (like H2O) or compound name (like water) to look up available properties and alternative names. The tool will search through the database and display any available physical properties and known alternative names for the compound.
Please let us know how we can improve this web app.
Menu Balance Molar mass Gas laws Units Chemistry tools Periodic table Chemical forum Symmetry Constants Contribute Contact us
How to cite?